A METHOD FOR INFRARED DIAGNOSTICS OF A PLASMA AND ITS USE FOR THE INVESTIGATION OF IONIZATION AND RECOMBINATION OF XENON BEHIND
A METHOD FOR INFRARED DIAGNOSTICS OF A PLASMA AND ITS USE FOR THE INVESTIGATION OF IONIZATION AND RECOMBINATION OF XENON BEHIND
复制标题
等离子体红外诊断方法及其用于研究背后氙的电离和复合的用途
DOI:
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发表时间:
2012
期刊:
影响因子:
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通讯作者:
V. P. Zimakov
中科院分区:
文献类型:
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作者:
N. Generalov;V. P. Zimakov
A method is described for the determination of the electron temperature and electron concentration profiles behind the front of a shock wave. It is based on simultaneous measurement of emission and absorption by the ionized gas in the infrared region of the spectrum (A = 10.6 microns). Results of an experimental investigation of ionization and recombination processes in xenon at T = 8200-9200°K are presented. Good agreement between the experimental data and recombination theory based on a modified FokkerPlanck theory is obtained.