Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression
Improving compression ratio, area overhead, and test application time for system-on-a-chip test data compression/decompression
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DOI：
10.1109/date.2002.998363
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发表时间：
2002-03
期刊：
影响因子：
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通讯作者：
P. T. Gonciari;B. Al-Hashimi;N. Nicolici
中科院分区：
文献类型：
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作者：
P. T. Gonciari;B. Al-Hashimi;N. Nicolici
提出了一种新的片上系统测试数据压缩/解压缩方法。该方法是在分析影响测试参数的因素的基础上提出的：压缩比、面积开销和测试应用时间。为了提高压缩比，新方法基于可变长度输入霍夫曼编码(VIHC)，该编码充分利用了模式的类型和长度，并在预处理步骤中提出了一种新的映射和重新排序算法。新的VIHC算法与一种新型的并行片上解码器相结合，同时导致了较低的测试应用时间和较低的面积开销。结果表明，该方法不同于以往的三种以牺牲部分试验参数为代价来减少试验参数的方法，它能够同时改善这三个参数。通过基准电路的实验比较，验证了该方法的有效性。
Proposes a new test data compression/decompression method for systems-on-a-chip. The method is based on analyzing the factors that influence test parameters: compression ratio, area overhead and test application time. To improve compression ratio, the new method is based on a variable-length input Huffman coding (VIHC), which fully exploits the type and length of the patterns, as well as a novel mapping and reordering algorithm proposed in a pre-processing step. The new VIHC algorithm is combined with a novel parallel on-chip decoder that simultaneously leads to low test application time and low area overhead. It is shown that, unlike three previous approaches which reduce some test parameters at the expense of the others, the proposed method is capable of improving all the three parameters simultaneously. An experimental comparison on benchmark circuits validates the proposed method.