Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging
Heteroepitaxial passivation of Cs2AgBiBr6 wafers with suppressed ionic migration for X-ray imaging
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用于 X 射线成像的 Cs2AgBiBr6 晶圆异质外延钝化,抑制离子迁移
DOI:
10.1038/s41467-019-09968-3
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发表时间:
2019-04
影响因子:
16.6
通讯作者:
Tang Jiang
中科院分区:
文献类型:
--
作者:
Yang Bo;Pan Weicheng;Wu Haodi;Niu Guangda;Yuan Jun-Hui;Xue Kan-Hao;Yin Lixiao;Du Xinyuan;Miao Xiang-Shui;Yang Xiaoquan;Xie Qingguo;Tang Jiang
X-ray detectors are broadly utilized in medical imaging and product inspection. Halide perovskites recently demonstrate excellent performance for direct X-ray detection. However, ionic migration causes large noise and baseline drift, limiting the detection and imaging performance. Here we largely eliminate the ionic migration in cesium silver bismuth bromide (Cs2AgBiBr6) polycrystalline wafers by introducing bismuth oxybromide (BiOBr) as heteroepitaxial passivation layers. Good lattice match between BiOBr and Cs2AgBiBr6 enables complete defect passivation and suppressed ionic migration. The detector hence achieves outstanding balanced performance with a signal drifting one order of magnitude lower than all previous studies, low noise (1/f noise free), a high sensitivity of 250 µC Gy air−1 cm–2, and a spatial resolution of 4.9 lp mm−1. The wafer area could be easily scaled up by the isostatic-pressing method, together with the heteroepitaxial passivation, strengthens the competitiveness of Cs2AgBiBr6-based X-ray detectors as next-generation X-ray imaging flat panels.
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影响因子:
35
作者:
Yakunin S;Sytnyk M;Kriegner D;Shrestha S;Richter M;Matt GJ;Azimi H;Brabec CJ;Stangl J;Kovalenko MV;Heiss W
通讯作者:
Heiss W
影响因子:
5.7
作者:
Volonakis, George;Filip, Marina R.;Giustino, Feliciano
通讯作者:
Giustino, Feliciano
影响因子:
3.7
作者:
Kresse, G;Furthmuller, J
通讯作者:
Furthmuller, J
影响因子:
3.7
作者:
Stevanovic, Vladan;Lany, Stephan;Zunger, Alex
通讯作者:
Zunger, Alex
影响因子:
3.7
作者:
Ferreira, Luiz G.;Marques, Marcelo;Teles, Lara K.
通讯作者:
Teles, Lara K.