Heavy ion linear energy transfer measurements during single event upset testing of electronic devices
Heavy ion linear energy transfer measurements during single event upset testing of electronic devices
复制标题
电子设备单粒子翻转测试期间的重离子线性能量传递测量
DOI：
10.1109/23.747768
复制
发表时间：
1999
影响因子：
1.8
通讯作者：
P. Thieberger
中科院分区：
文献类型：
--
作者：
V. Zajic;P. Thieberger
描述了安装在布鲁克海文单粒子翻转测试设施的重离子束诊断系统。讨论了借助 a 粒子对系统进行校准，这对于线性能量传递 (LET) 测量至关重要。测量 20 种不同离子的 LET 值，包括 /sup 7/Li、/sup 9/B、/sup 12/C、/sup 16/O、/sup 19/F、/sup 28/Si、/sup 32/S、/sup 35/Cl、/sup 40/Ca、/sup 45/Sc、/sup 48/Ti、/sup 56/Fe、/sup 58/Ni、/sup 63/Cu、/sup 74/Ge、/sup 79/Br、/sup 107/Ag、/sup 127/I、/sup 197/Au 和 /sup 235/U，能量在 0.5 至 8.5 MeV/AMU 之间，但最重不超过 400 MeV离子，以图形和数字形式呈现。将结果与 TRIM-90 模拟程序的预测进行比较，测量值和计算值之间的平均差异为 2/spl plusmn/6%。
A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of a-particles, essential for linear energy transfer (LET) measurements, is discussed. Measured LET values for 20 different ions, including /sup 7/Li, /sup 9/B, /sup 12/C, /sup 16/O, /sup 19/F, /sup 28/Si, /sup 32/S, /sup 35/Cl, /sup 40/Ca, /sup 45/Sc, /sup 48/Ti, /sup 56/Fe, /sup 58/Ni, /sup 63/Cu, /sup 74/Ge, /sup 79/Br, /sup 107/Ag, /sup 127/I, /sup 197/Au, and /sup 235/U, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions, are presented in both graphical and numerical forms. Results are compared to predictions of the TRIM-90 simulation program, with an average difference between the measured and calculated values of 2/spl plusmn/6%.