Latest developments in microtomography and nanotomography at PETRA III
Latest developments in microtomography and nanotomography at PETRA III
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DOI：
10.1154/1.3428364
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发表时间：
2010-06-01
影响因子：
0.5
通讯作者：
Schreyer, A.
中科院分区：
文献类型：
--
作者：
Haibel, A.;Beckmann, F.;Schreyer, A.
由于新的Petra III同步加速器非凡的光束特性，即高亮度、1 nm rad的极低发射率以及即使在硬X射线范围内也能产生高比例的相干光子，Petra III的成像光束线(IBL)将提供最先进的成像和层析成像能力，分辨率高达纳米级。层析成像技术的新应用允许高速原位测量以及最高的空间和密度分辨率。此外，高度相干的光束能够以一种特殊的方式应用相衬方法。由于重点放在5keV至50keV的能量范围内，IBL将特别适合于工程材料科学小样本的显微断层扫描和纳米断层扫描，以及用于研究软物质、骨骼、医疗植入物和生物材料。(C)2010年国际绕射数据中心。[DOI：10.1154/1.3428364]
Due to the extraordinary beam characteristics of the new PETRA III synchrotron, i.e., the high brilliance, the extremely low emittance of 1 nm rad, and the high fraction of coherent photons even in the hard X-ray range, the imaging beamline (IBL) at PETRA III will provide state of the art imaging and tomography capabilities with resolution well into the nanometer range. Novel applications of tomographic techniques allow for high speed in situ measurements as well as highest spatial and density resolutions. Additionally, the highly coherent beam enables the application of phase contrast methods in an exceptional way. Since the focus is on the energy range between 5 and 50 keV, the IBL will among others be ideally suited for microtomography and nanotomography on small engineering materials science samples as well as for studying soft matter, bones, medical implants, and biomatter. (C) 2010 International Centre for Diffraction Data. [DOI: 10.1154/1.3428364]