Micro-electrode wear and compensation to ensure the dimensional consistency accuracy of micro-hole array in micro-EDM drilling
Micro-electrode wear and compensation to ensure the dimensional consistency accuracy of micro-hole array in micro-EDM drilling
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DOI:
10.1007/s00170-020-05811-y
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发表时间:
2020-11-01
影响因子:
3.4
通讯作者:
Shaojie, Hou
中科院分区:
文献类型:
--
作者:
Huan, Liu;Jicheng, Bai;Shaojie, Hou
The micro-hole array machined by microelectrical discharge machining (micro-EDM) has been widely used in industrial fields, such as inkjet nozzle, oil nozzle, spinneret, and so on. However, it is difficult to guarantee the dimensional consistency accuracy of micro-hole array. In the present study, the characteristic and compensation strategy of microelectrode wear were explored to meet the requirements of dimensional consistency accuracy of micro-hole array machining. The effect of pulse generator parameters on microelectrode wear was studied, and the microelectrode wear was reduced by optimizing pulse generator parameters. The geometry evolution rule of microelectrode was investigated, and the microelectrode wear model was established based on the wear characteristic of microelectrode. By analyzing the wear characteristic of microelectrode, single-hole quantitative compensation strategy was adopted during the machining process. Meanwhile, grouping detection variable compensation strategy was proposed to adjust axial position of microelectrode periodically in order to eliminate the cumulative compensation errors. The array of 256 (16 x 16) micro-holes with an average diameter of 45.28 mu m was machined on a 50-mu m-thick stainless steel. The dimensional consistency accuracy of micro-hole array was assured by showing a standard deviation of 0.15 mu m. In addition, the array of 64 (8 x 8) micro-holes and the array of 25 (5 x 5) micro-holes with an average diameter of less than 20 mu m were machined to explore the performance of micro-hole array machining with smaller size, and the dimensional consistency accuracy was shown by the standard deviation of 0.25 and 0.4 mu m, respectively.