A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits
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DOI：
10.1109/12.277291
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发表时间：
1993-06
期刊：
影响因子：
--
通讯作者：
I. Koren;Z. Koren;C. Stapper
中科院分区：
文献类型：
--
作者：
I. Koren;Z. Koren;C. Stapper
已经认识到容错VLSI电路的成品率取决于故障簇的大小。据此，提出了基于双参数负二项分布的大面积聚类和小面积聚类产量分析模型。提出了在现有的两个断层分布参数的基础上增加一个新的参数--块体大小。该参数允许统一现有的模型，同时增加了整个范围的中等规模的集群模型。因此，增加了选择适当收益率模型的灵活性。给出了新定义的块大小的估计方法，并通过仿真和经验数据验证了该方法的有效性。>；
It has been recognized that the yield of fault-tolerant VLSI circuits depends on the size of the fault clusters. Consequently, models for yield analysis have been proposed for large-area clustering and small-area clustering, based on the two-parameter negative-binomial distribution. The addition of a new parameter, the block size, to the two existing parameters of the fault distribution is proposed. This parameter allows the unification of the existing models and, at the same time, adds a whole range of medium-size clustering models. Thus, the flexibility in choosing the appropriate yield model is increased. Methods for estimating the newly defined block size are presented and the approach is validated through simulation and empirical data. >