Exchange-bias in amorphous ferromagnetic and polycrystalline antiferromagnetic bilayers: Structural study and micromagnetic modeling
Exchange-bias in amorphous ferromagnetic and polycrystalline antiferromagnetic bilayers: Structural study and micromagnetic modeling
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DOI：
10.1063/1.3559261
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发表时间：
2011-04
影响因子：
3.2
通讯作者：
A. Kohn;J. Dean;A. Kovács;A. Zeltser;M. Carey;D. Geiger;G. Hrkac;T. Schrefl;D. Allwood
中科院分区：
文献类型：
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作者：
A. Kohn;J. Dean;A. Kovács;A. Zeltser;M. Carey;D. Geiger;G. Hrkac;T. Schrefl;D. Allwood
我们研究了反铁磁多晶金属薄膜的结构在决定交换耦合非晶铁磁层的磁性中的作用。该双层膜是溅射沉积的高度织构的{111} Ir 22 Mn 78和Co65.5Fe14.5B20薄膜。我们专注于Ir 22 Mn 78的结构表征作为层厚度的函数的范围内具有最强的影响交换偏置场和培训效果。我们已经使用透射电子显微镜来表征界面台阶和粗糙度，相互扩散，孪晶和晶界的形式的缺陷。这种缺陷会导致反铁磁体中的未补偿的磁自旋，然后导致交换偏置。这些实验结果形成了一个通用模型的基础上，它使用有限元微磁模拟。该模型采用了实验的双层结构参数，通过实施表面积分技术，允许数值计算来解决…
We study the role of the structure of antiferromagnetic polycrystalline metallic films in determining the magnetic properties of an exchange-coupled amorphous ferromagnetic layer. The bilayers are sputter-deposited, highly textured {111} Ir22Mn78 and Co65.5Fe14.5B20 thin films. We focus on structural characterization of Ir22Mn78 as a function of layer thickness in the range having the strongest influence over the exchange-bias field and training effect. We have used transmission electron microscopy to characterize defects in the form of interface steps and roughness, interdiffusion, twin- and grain-boundaries. Such defects can result in uncompensated magnetic spins in the antiferromagnet, which then contribute to exchange-bias. These experimental results form the basis of a general model, which uses finite element micromagnetic simulations. The model incorporates the experimental structural parameters of the bilayer by implementing a surface integral technique that allows numerical calculations to solve t...