Dynamic optical spectroscopy and pyrometry of static targets under optical and x-ray laser heating at the European XFEL
Dynamic optical spectroscopy and pyrometry of static targets under optical and x-ray laser heating at the European XFEL
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DOI：
10.1063/5.0142196
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发表时间：
2023-08
影响因子：
3.2
通讯作者：
O. B. Ball;C. Prescher;K. Appel;C. Baehtz;M. A. Baron;R. Briggs;V. Cerantola;J. Chantel;S. Chariton;A. Coleman;H. Cynn;H. Damker;D. Dattelbaum;L. Dresselhaus-Marais;J. Eggert;L. Ehm;W. J. Evans;G. Fiquet;M. Frost;K. Glazyrin;A. Goncharov;R. Husband;H. Hwang;N. Jaisle;Z. Jenei;J. Kim;Y. Lee;H. Liermann;J. Mainberger;M. Makita;H. Marquardt;E. McBride;J. D. McHardy;M. McMahon;S. Merkel;G. Morard;E. O’Bannon;C. Otzen;E. J. Pace;A. Pelka;C. Pépin;J. Pigott;C. Plückthun;V. Prakapenka;R. Redmer;S. Speziale;G. Spiekermann;C. Strohm;B. Sturtevant;P. Talkovski;L. Wollenweber;U. Zastrau;R. McWilliams;Z. Konôpková
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作者：
O. B. Ball;C. Prescher;K. Appel;C. Baehtz;M. A. Baron;R. Briggs;V. Cerantola;J. Chantel;S. Chariton;A. Coleman;H. Cynn;H. Damker;D. Dattelbaum;L. Dresselhaus-Marais;J. Eggert;L. Ehm;W. J. Evans;G. Fiquet;M. Frost;K. Glazyrin;A. Goncharov;R. Husband;H. Hwang;N. Jaisle;Z. Jenei;J. Kim;Y. Lee;H. Liermann;J. Mainberger;M. Makita;H. Marquardt;E. McBride;J. D. McHardy;M. McMahon;S. Merkel;G. Morard;E. O’Bannon;C. Otzen;E. J. Pace;A. Pelka;C. Pépin;J. Pigott;C. Plückthun;V. Prakapenka;R. Redmer;S. Speziale;G. Spiekermann;C. Strohm;B. Sturtevant;P. Talkovski;L. Wollenweber;U. Zastrau;R. McWilliams;Z. Konôpková
X 射线自由电子激光器 (XFEL) 极端条件的实验涉及快速变化的温度条件。在这里，我们报告了在欧洲 XFEL 的高能量密度仪器上使用 X 射线光谱条纹光学高温测量和光学激光加热状态进行的时间分辨直接温度测量。这一系列典型实验与数值模型相结合，概述了使用 XFEL 源光发射进行时间相关温度测量的可靠性、精度和意义。使用单次和集成模式，通过 450-850 nm 处的光谱和时间分辨热发射连续测量 1500 K 以上的动态温度，对于 1-200 μs 条纹相机窗口，时间分辨率低至 10-100 ns。靶材包括在空气和真空中独立的零压箔，以及在金刚石砧室多层靶材中压缩的高压样品。使用的辐射源是 17.8 keV 的 20-fs 硬 X 射线激光脉冲，采用单脉冲或最多 30 个脉冲的 2.26 MHz 脉冲串，以及 250-ns 红外激光单脉冲。还探索了使用条纹光谱在 X 射线激光实验中对可见光进行光学测量的一系列进一步的可能性，包括研究 X 射线诱导的光学荧光，它经常作为热辐射测量的背景出现。我们建立了几种观察多种来源的综合排放的情景，并讨论了它们的解释。解决了使用 X 射线激光器作为样品状态非侵入式探针所带来的挑战。
Experiments accessing extreme conditions at x-ray free electron lasers (XFELs) involve rapidly evolving conditions of temperature. Here, we report time-resolved, direct measurements of temperature using spectral streaked optical pyrometry of x-ray and optical laser-heated states at the High Energy Density instrument of the European XFEL. This collection of typical experiments, coupled with numerical models, outlines the reliability, precision, and meaning of time dependent temperature measurements using optical emission at XFEL sources. Dynamic temperatures above 1500 K are measured continuously from spectrally- and temporally-resolved thermal emission at 450–850 nm, with time resolution down to 10–100 ns for 1–200 μs streak camera windows, using single shot and integrated modes. Targets include zero-pressure foils free-standing in air and in vacuo, and high-pressure samples compressed in diamond anvil cell multi-layer targets. Radiation sources used are 20-fs hard x-ray laser pulses at 17.8 keV, in single pulses or 2.26 MHz pulse trains of up to 30 pulses, and 250-ns infrared laser single pulses. A range of further possibilities for optical measurements of visible light in x-ray laser experiments using streak optical spectroscopy are also explored, including for the study of x-ray induced optical fluorescence, which often appears as background in thermal radiation measurements. We establish several scenarios where combined emissions from multiple sources are observed and discuss their interpretation. Challenges posed by using x-ray lasers as non-invasive probes of the sample state are addressed.