Application of position sensitive detector for the electron detachment cross-sections measurement
Application of position sensitive detector for the electron detachment cross-sections measurement
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DOI:
10.1016/j.nima.2009.11.062
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发表时间:
2010-02
影响因子:
1.4
通讯作者:
Jun Zhao;X. Bai;Junqin Li;Xuemei Zhang;B. Wei;Y. Zou
中科院分区:
文献类型:
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作者:
Jun Zhao;X. Bai;Junqin Li;Xuemei Zhang;B. Wei;Y. Zou
In this paper, we report our improved detection system based on a micro-channel plate (MCP) position sensitive detector, which could simplify our experiment process of the electron detachment cross-sections measurement in negative ion–gas collisions. The operating parameters of MCP are investigated thoroughly, and we present the dependence of the pulse height distributions (PHD) of the anode signals on MCP bias voltage, incident beam energy, incident beam intensity, and incident ion species. The optimum parameters, such as bias voltage of the MCP, the threshold of the electronics and incident ions intensity, are determined. The saturation curve of MCP is also shown. Finally, we give the single electron detachment cross-sections of H−and C−in collision with N2obtained using the new position sensitive detection system. Consistency with other available experiment results shows the reliability of the new detection system.