Anisotropic x-ray magnetic linear dichroism at the fe l2,3 edges in fe3o4 thin films and other systems

Anisotropic x-ray magnetic linear dichroism at the fe l2,3 edges in fe3o4 thin films and other systems
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fe3o4 薄膜和其他系统中 fe l2,3 边缘的各向异性 X 射线磁线性二向色性

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发表时间:
2007
期刊:
影响因子:
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通讯作者:
G. Laan
G. Laan
中科院分区:
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文献类型:
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作者:
E. Arenholz;G. Laan

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对由具有非常不同的磁性特性的多层组成的工程磁性纳米结构中的自旋排列的详细了解对于调整其特性以适应信息存储技术中的设备应用至关重要。软 X 射线磁二色性光谱在提高我们对复杂异磁纳米结构的理解方面发挥着越来越大的作用,因为这些技术提供了具有高灵敏度和可调探测深度的元素和化学位点特定的磁信息。因此,使用 X 射线磁线性和圆二色光谱与显微镜的创造性组合,研究了在反铁磁体上生长的铁磁层的界面耦合,例如 Co/LaFeO 3 [1] 和 Co/NiO [2] 等界面。此外,还分析了铁磁Co层的磁化反转对Co/NiO系统中底层NiO的影响[3​​],以及Fe覆盖层厚度对Fe/NiO系统中Fe和NiO交换耦合的影响[4]。在 L Fe 3 和
The detailed knowledge of the spin arrangements in engineered magnetic nanostructures comprised of multiple layers with very different magnetic characteristics is essential to tailor their properties for device applications in information storage technology. Soft x-ray magnetic dichroism spectroscopies play an ever increasing role in improving our understanding of complex heteromagnetic nanostructures since these techniques provide elemental and chemical site-specific magnetic information with high sensitivity and tunable probing depth. So has the interface coupling of a ferromagnetic layer grown on an antiferromagnet been studied for interfaces like Co/LaFeO 3 [1] and Co/NiO [2] using a creative combination of x ray magnetic linear and circular dichroism spectroscopy and microscopy. Moreover, the impact of the magnetization reversal in a ferromagnetic Co layer on the underlaying NiO in Co/NiO systems [3] and the influence of the Fe overlayer thickness on the exchange coupling of Fe and NiO in Fe/NiO systems has been analyzed [4]. It obvious magnetic microscopy spectral magnitude description (XMLD) at the L Fe 3 and