Scan performance of infinite arrays of microstrip patch elements loaded with varactor diodes
Scan performance of infinite arrays of microstrip patch elements loaded with varactor diodes
复制标题
加载变容二极管的微带贴片元件无限阵列的扫描性能
DOI：
--
复制
发表时间：
1993
期刊：
影响因子：
--
通讯作者：
N. Shuley
中科院分区：
文献类型：
--
作者：
R. Waterhouse;N. Shuley
介绍了每个加载变容二极管的矩形微带贴片无限阵列的分析和扫描特性。该分析基于全波矩法理论，并使用连接模式对通过馈电和二极管的电流进行精确建模。给出了偏置变容二极管对扫描性能的影响，结果表明可以消除扫描盲性引起的阻抗失配。还给出了其他特性，例如：有源元件增益、每个加载微带元件的效率以及贴片加载产生的交叉极化水平。还考虑了二极管偏置电平以及每个辐射元件上的二极管位置对这些扫描特性的影响。 >
The analysis and scanning characteristics of an infinite array of rectangular microstrip patches each loaded with a varactor diode is presented. The analysis is based on full-wave moment method theory and uses attachment modes to accurately model the current through the feed and the diode. The effect of the biased varactor diode on the scan performance is presented, and it is shown that the impedance mismatch caused by a scan blindness can be eliminated. Other characteristics are also given such as: the active element gain, the efficiency of each loaded microstrip element, and the level of cross polarization generated by the loading of the patch. The effect of the diode biasing level as well as the position of the diode on each radiating element on these scan characteristics is also considered. >