Probing Charges on the Atomic Scale by Means of Atomic Microscopy
Probing Charges on the Atomic Scale by Means of Atomic Microscopy
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DOI：
10.1103/physrevlett.115.076101
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发表时间：
2015-08-13
影响因子：
8.6
通讯作者：
Jelinek, P.
中科院分区：
文献类型：
--
作者：
Albrecht, F.;Repp, J.;Jelinek, P.
用开尔文探针力光谱表征了具有极性键的单个分子的电荷分布。虽然这项技术在大的尖端-分子分离中以中等分辨率表示电荷分布，但它在较短的距离内失败。在这里，我们介绍了一种新的局域力光谱技术，它允许人们更好地将静电与力信号中的其他贡献分开。它使人们能够在更近的针尖-样品距离处获得与电荷相关的地图，从而进一步提高横向分辨率。这种增强的分辨率使人们能够解决沿着单个极键的对比度变化。
Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other contributions in the force signal. It enables one to obtain charge-related maps at even closer tip-sample distances, where the lateral resolution is further enhanced. This enhanced resolution allows one to resolve contrast variations along individual polar bonds.