Quartz Microbalance Studies of an Adsorbed Helium Film
Quartz Microbalance Studies of an Adsorbed Helium Film
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吸附氦膜的石英微天平研究
DOI：
10.1103/physrevlett.29.211
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发表时间：
1972
影响因子：
8.6
通讯作者：
J. Stephens
中科院分区：
文献类型：
--
作者：
M. Chester;Lan Yang;J. Stephens
在厚度剪切模式中振荡的石英晶体的谐振频率由于其表面上铺设的任何类型的膜的质量负载而改变。对于氦膜，只有法向分数保持与衬底运动刚性耦合。用这种技术测量的He-4的吸附等温线显示出明显偏离传统的非超流行为。我们把这种效应归因于薄膜中超流性的出现和存在。
The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of He-4 measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.