X-Ray Photoelectron Spectroscopy
X-Ray Photoelectron Spectroscopy
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DOI：
10.1201/b11100-21
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
Arena Holguin;Sylvia Navidad;Gabriela Gonzalez
中科院分区：
文献类型：
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作者：
Arena Holguin;Sylvia Navidad;Gabriela Gonzalez
X 射线光电子能谱是电子能谱的一种形式，其中用单色 X 射线束照射样品并测量所得光电子的能量。物理学家 K. Siegbahn 开创了化学分析电子能谱 (ESCA)（现在称为 X 射线光电子能谱 (XPS)）及其在科学中的应用。 1981 年，Siegbahn 因其对 XPS 工作的贡献而获得小说奖，XPS 是一种非常有用的技术，可以获取有关被分析化合物的氧化态和原子组成的信息。 XPS 涉及基于阿尔伯特·爱因斯坦描述的光电子效应的单电子过程。
X-ray photoelectron spectroscopy is a form of electron spectroscopy in which a sample is irradiated with a beam of monochromatic x-rays and the energies of the resulting photoelectron are measured. The physicist K. Siegbahn initiated the electron spectroscopy for chemical analysis (ESCA) now known as X-ray photoelectron spectroscopy (XPS) and its applications in science. In 1981 Siegbahn won the Novel Prize for his contribution to his work on XPS, which is a very helpful technique in obtaining information about oxidation state and atomic composition of analyzed compounds. XPS involves a single electron process which is based on the photoelectron effect described by Albert Einstein.