Hard x-ray intensity autocorrelation using direct two-photon absorption
Hard x-ray intensity autocorrelation using direct two-photon absorption
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DOI：
10.1103/physrevresearch.4.l012035
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发表时间：
2022-03
影响因子：
4.2
通讯作者：
T. Osaka;I. Inoue;J. Yamada;Y. Inubushi;Shotaro Matsumura;Y. Sano;K. Tono;K. Yamauchi;K. Tamasaku;M. Yabashi
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文献类型：
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作者：
T. Osaka;I. Inoue;J. Yamada;Y. Inubushi;Shotaro Matsumura;Y. Sano;K. Tono;K. Yamauchi;K. Tamasaku;M. Yabashi
采用强度自相关测量来表征来自分裂延迟光学（SDO）系统的9 keV X射线自由电子激光（XFEL）脉冲的脉冲持续时间，该系统在每个分支中具有四次反弹硅220反射。具有可变时间延迟的XFEL脉冲副本由SDO系统本身产生。在自注入操作中获得的高强度和仔细的数据分析允许直接双光子吸收测量。在高斯假设下，自相关迹线的持续时间为半峰全宽.此外，跟踪显示出良好的协议与模拟的XFEL脉冲形状传播通过SDO系统，在原始XFEL脉冲的光谱啁啾无关。我们的研究结果打开了大门，直接的时间表征窄带XFEL在硬X射线制度，如自种子和未来的腔为基础的XFEL，并指出了一个坚实的方式，时间剪裁的超快X射线脉冲与完美的晶体。
An intensity autocorrelation measurement is demonstrated to characterize a pulse duration of 9-keV x-ray free-electron laser (XFEL) pulses from a split-delay optical (SDO) system with four-bounce silicon 220 reflections in each branch. XFEL pulse replicas with variable time delays are generated by the SDO system itself. High intensity ofachieved in a self-seeding operation and careful data analysis allow the measurement with direct two-photon absorption. The autocorrelation trace gave a duration ofin full width at half maximum for a Gaussian assumption. Furthermore, the trace shows good agreement with a simulation of the XFEL pulse shape propagating through the SDO system, irrespective of spectral chirps in the original XFEL pulses. Our results open the door toward direct temporal characterization of narrowband XFELs at the hard x-ray regime, such as self-seeded and future cavity-based XFELs, and indicate a solid way for temporal tailoring of ultrafast x-ray pulses with perfect crystals.