Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry
Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry
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DOI：
10.1364/oe.20.024977
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发表时间：
2012-10-22
期刊：
影响因子：
3.8
通讯作者：
Yamauchi, Kazuto
中科院分区：
文献类型：
--
作者：
Matsuyama, Satoshi;Yokoyama, Hikaru;Yamauchi, Kazuto
在 SPring-8 1 公里长的光束线中演示了基于塔尔伯特效应和傅立叶变换方法的单光栅干涉测量硬 X 射线纳米束的波前测量。使用全反射椭圆镜将 10 keV X 射线一维聚焦至 32 nm。使用放置在聚焦镜上游的可变形镜产生故意扭曲的波前。使用光束腰部周围的强度分布，将干涉测量法测量的波前与相位恢复方法进行交叉检查。对所获得的波前误差的比较表明，它们彼此之间非常一致，并且与根据可变形镜的形状估计的波前误差在大约0.5rad水平上非常一致。 (C) 2012年美国光学学会
Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a similar to 0.5 rad level. (C) 2012 Optical Society of America