Electrical breakdown of short multiwalled carbon nanotubes
Electrical breakdown of short multiwalled carbon nanotubes
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DOI：
10.1063/1.2364048
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发表时间：
2006-11
影响因子：
3.2
通讯作者：
M. Tsutsui;Yu-ki Taninouchi;S. Kurokawa;A. Sakai
中科院分区：
文献类型：
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作者：
M. Tsutsui;Yu-ki Taninouchi;S. Kurokawa;A. Sakai
利用金电极的机械可控断裂结技术研究了短（∼50nm）多壁碳纳米管（MWNT）的电击穿。对击穿点附近电导偏置特性的测量揭示了短 MWNT 的两种不同类型的击穿行为。在称为类型 I 的一种类型中，电导随偏压几乎线性增加，并且在超过击穿点时逐步减小。另一方面，在 II 型击穿中，电导在击穿之前显示出短暂且不可逆的增加，然后跳至零。我们认为真空中的 II 型击穿与接触相关，而 I 型击穿是通过通常的 MWNT 加热发生的。
Electrical breakdown of short (∼50nm) multiwalled carbon nanotubes (MWNTs) is studied utilizing mechanically controllable break junction technique with gold electrodes. Measurements of the conductance-bias characteristics near the breakdown point revealed two different types of breakdown behavior for the short MWNTs. In one type designated as type I, the conductance increases nearly linearly with the bias and, over the breakdown point, decreases stepwise. On the other hand, in the type-II breakdown, the conductance shows a transient and irreversible increase right before the breakdown and subsequently jumps to zero. We consider that the type-II breakdown in vacuum is contact related, whereas the type-I breakdown occurs through the usual MWNT heating.