Principle of an in-situ relative calibration method using a double-pass beam for Thomson scattering diagnostics
Principle of an in-situ relative calibration method using a double-pass beam for Thomson scattering diagnostics
复制标题
使用双通光束进行汤姆逊散射诊断的原位相对校准方法的原理
DOI：
10.1088/1748-0221/7/05/c05004
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
K. Itami
中科院分区：
文献类型：
--
作者：
H. Tojo;T. Hatae;K. Itami
本文介绍了一种不使用光学相对透射率测量电子温度（Te）的原位相对定标方法的详细原理，并给出了该方法的光学相对透射率。在该方法中，使用双通散射系统，并且测量由于每个光谱通道中的前向散射和后向散射引起的两个信号之间的比率。来自两个散射的每个信号必须使用具有快速响应时间的检测器来解析。统计模拟结果表明，该方法抑制了由于辐射效应引起的光学元件色度退化所引起的Te系统误差。统计误差几乎与标准方法相同，标准方法使用测量的波长谱从单次通过确定电子温度和密度。在该方法中，散射角θ和Te是评价其可行性的重要参数。因此，研究了不同θ的统计误差。结果表明，在Te = 10keV，θ> 10 5的范围内，该方法是有效的。高T e测量的统计误差趋于减少。
In this paper, we present the detailed principles of an in-situ relative calibration method used to determine electron temperature (T e) without using optical relative transmissivity and to obtain the optical relative transmissivity. In this method, a double-pass scattering system is used and ratio between the two signals due to forward and back scattering in each spectral channel is measured. Each signal from both the scattering must be resolved using detectors with a fast response time. Statistical simulation results indicate that the method suppresses the systematic error in T e caused by chromatic degradation in optical components because of the radiation effect. The statistical error is almost the same as that of the standard method, which uses the measured wavelength spectrum to determine the electron temperature and density from a single pass. In this new method, the scattering angle (θ) and T e are considered as important parameters for evaluating its feasibility. Therefore, statistical errors for various θ were investigated. As a result, we found that the method is effective in the range of θ> 105 at T e= 10 keV. The statistical error tends to decrease for high T e measurements.