Experimental Study of Perpendicular Write Heads at Data Rates Beyond 2 Gb/s
Experimental Study of Perpendicular Write Heads at Data Rates Beyond 2 Gb/s
复制标题
数据速率超过 2 Gb/s 的垂直写入磁头的实验研究
DOI：
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发表时间：
2006
影响因子：
2.1
通讯作者：
J. Zhu
中科院分区：
文献类型：
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作者：
Yuchen Zhou;J. Zhu
利用射频探头改进的接触式测试仪用于测试频率高达3.3 GHz的滑块级垂直写头。该设置能够以极高的频率演示记录动态效果。已经进行了使用深亚纳秒脉冲宽度的单脉冲写入作为写入电流幅度的函数的研究。亚纳秒级写入显示出明显的电流极性依赖关系。在不同频率和电流幅度下执行的交流擦除表明，可能的磁头磁化动态可能导致在非常高的电流开关频率下交流磁场退化和消失。对于某些磁头，在某些驱动频率下的交流擦除能够将磁头的磁化锁定到剩磁状态，而不是使其退磁
A modified contact tester utilizing RF probes is used to test perpendicular write heads at slider level with frequencies up to 3.3 GHz. The setup enables demonstration of the recording dynamic effects at extremely high frequency. A study using single pulse writing at deep sub-nanosecond pulse widths has been performed as a function of write current amplitude. The sub-nanosecond writes show clear current polarity dependence. AC erasure performed at different frequencies and current amplitudes indicates possible head magnetization dynamics that may cause the ac field degradation and disappearance at very high current switching frequencies. For some head, the ac erasure at certain driving frequencies is able to lock the head magnetization into remanence state instead of demagnetizing it