Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System
复制标题
使用部分复制和比较来检测基于 FPGA 的商用网络系统中的辐射引起的故障
DOI：
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复制
发表时间：
2020
期刊：
影响因子：
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通讯作者：
Conner Chambers
中科院分区：
文献类型：
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作者：
Andrew M. Keller;Jared Anderson;M. Wirthlin;Shi;R. Fung;Conner Chambers
复制与比较是一种电路级故障检测技术，在本研究中以部分方式使用，以检测基于 FPGA 的商用网络系统中由辐射引起的故障。采用一种新颖的方法来克服多个时钟域、第三方 IP 的使用以及分散在整个设计中的错误检测信号的收集带来的挑战。新颖的故障注入技术也用于评估目标设计的关键区域。进行加速中子辐射测试以评估所应用技术的有效性。一种设计版本能够检测出 45% 的故障，并将所提出的技术应用于设计中 29% 的电路组件。另一个设计版本能够检测到 31% 的故障，而所提出的技术仅应用于 8% 的电路组件。
Duplication with compare, a circuit-level fault-detection technique, is used in this study in a partial manner to detect radiation-induced failures in a commercial FPGA-based networking system. A novel approach is taken to overcome challenges presented by multiple clock domains, the use of third-party IP, and the collection of error detection signals dispersed throughout the design. Novel fault injection techniques are also used to evaluate critical regions of the target design. Accelerated neutron radiation testing was performed to evaluate the effectiveness of the applied technique. One design version was able to detect 45% of all failures with the proposed technique applied to 29% of the circuit components within the design. Another design version was able to detect 31% of all failures with the proposed technique applied to only 8% of circuit components.