Magnetic-field-induced robust zero Hall plateau state in MnBi(2)Te(4) Chern insulator.
Magnetic-field-induced robust zero Hall plateau state in MnBi(2)Te(4) Chern insulator.
复制标题
MNBI(2)TE(4)Chern绝缘子在MNBI中磁场诱导的稳健零霍尔高原状态。
DOI:
10.1038/s41467-021-25002-x
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发表时间:
2021-07-30
影响因子:
16.6
通讯作者:
Wang Y
中科院分区:
文献类型:
--
作者:
Liu C;Wang Y;Yang M;Mao J;Li H;Li Y;Li J;Zhu H;Wang J;Li L;Wu Y;Xu Y;Zhang J;Wang Y
The intrinsic antiferromagnetic topological insulator MnBi2Te4 provides an ideal platform for exploring exotic topological quantum phenomena. Recently, the Chern insulator and axion insulator phases have been realized in few-layer MnBi2Te4 devices at low magnetic field regime. However, the fate of MnBi2Te4 in high magnetic field has never been explored in experiment. In this work, we report transport studies of exfoliated MnBi2Te4 flakes in pulsed magnetic fields up to 61.5 T. In the high-field limit, the Chern insulator phase with Chern number C = −1 evolves into a robust zero Hall resistance plateau state. Nonlocal transport measurements and theoretical calculations demonstrate that the charge transport in the zero Hall plateau state is conducted by two counter-propagating edge states that arise from the combined effects of Landau levels and large Zeeman effect in strong magnetic fields. Our result demonstrates the intricate interplay among intrinsic magnetic order, external magnetic field, and nontrivial band topology in MnBi2Te4. The antiferromagnetic topological insulator MnBi2Te4 exhibits Chern and axion insulator phases at low magnetic field; however, its behaviour in high magnetic field has remained unexplored. Here, using transport measurements at high magnetic field, the authors report a zero Hall plateau composed of two counter-propagating edge channels.
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影响因子:
56.9
作者:
Bernevig, B. Andrei;Hughes, Taylor L.;Zhang, Shou-Cheng
通讯作者:
Zhang, Shou-Cheng
影响因子:
56.9
作者:
Koenig, Markus;Wiedmann, Steffen;Zhang, Shou-Cheng
通讯作者:
Zhang, Shou-Cheng
影响因子:
3.7
作者:
Kresse, G;Furthmuller, J
通讯作者:
Furthmuller, J
影响因子:
44.1
作者:
Duncan, F.;Haldane, M.
通讯作者:
Haldane, M.
影响因子:
8.6
作者:
Kane, CL;Mele, EJ
通讯作者:
Mele, EJ