Angle-Resolved Photoemission Spectroscopy Study of Topological Quantum Materials
Angle-Resolved Photoemission Spectroscopy Study of Topological Quantum Materials
复制标题
拓扑量子材料的角分辨光电发射光谱研究
DOI：
10.1146/annurev-matsci-070218-121852
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发表时间：
2020-07
影响因子：
9.7
通讯作者：
Yulin Chen
中科院分区：
文献类型：
--
作者：
Chaofan Zhang;Yiwei Li;Ding Pei;Zhongkai Liu;Yulin Chen
最近发现的拓扑量子材料（TQM）的电子结构，可以用某些拓扑不变量。在这些新材料中，不寻常的体电子和表面电子不仅引起了许多奇异的物理现象，而且还促进了潜在的新技术应用。为了表征这些新材料的不寻常的电子结构，研究人员使用角分辨光电子能谱（ARPES）作为一种有效的实验工具，直接可视化TQM独特的体相和表面电子结构。在这篇综述中，我们首先简要介绍了TQM和ARPES，其次是ARPES应用到不同的TQM，从拓扑绝缘体狄拉克和Weyl半金属的例子。最后，我们简要介绍了ARPES的发展现状及其在TQM研究中的潜在应用。
The recently discovered topological quantum materials (TQMs) have electronic structures that can be characterized by certain topological invariants. In these novel materials, the unusual bulk and surface electrons not only give rise to many exotic physical phenomena but also foster potential new technological applications. To characterize the unusual electronic structures of these new materials, investigators have used angle-resolved photoemission spectroscopy (ARPES) as an effective experimental tool to directly visualize the unique bulk and surface electronic structures of TQMs. In this review, we first give a brief introduction of TQMs and ARPES, which is followed by examples of the application of ARPES to different TQMs ranging from topological insulators to Dirac and Weyl semimetals. We conclude with a brief perspective of the current development of ARPES and its potential application in the study of TQMs.