Evaluation of a STM-SQUID probe microscope
Evaluation of a STM-SQUID probe microscope
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STM-SQUID 探针显微镜的评估
DOI：
10.1109/tasc.2010.2086033
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发表时间：
2011
影响因子：
1.8
通讯作者：
H. Itozaki
中科院分区：
文献类型：
--
作者：
N. Watanabe;T. Hayashi;M. Tachiki;D. He;H. Itozaki
我们已经开发了一个STM-SQUID探针显微镜，结合了SQUID探针显微镜和扫描隧道显微镜（STM）。我们通过使用高磁导率坡莫合金探针向SQUID传输磁场来提高SQUID探针显微镜的空间分辨率。它可以同时测量样品表面的形貌和样品的磁场，使用坡莫合金探针作为STM探针。在本研究中，我们测量了一条线加间距为10 μm的弯折线产生的磁场分布。的曲折线是有用的，用于估计的STM-SQUID探针显微镜的性能，因为我们可以量化的曲折线的磁场，其中施加电流。我们还测量了样品表面上的磁场的磁力显微镜（MFM），并将这些测量结果与STM-SQUID探针显微镜获得的测量结果进行了比较。MFM测量受到样品表面的影响。然而，在STM-SQUID测量中没有观察到这种效应。
We have developed a STM-SQUID probe microscope that combines a SQUID probe microscope and a scanning tunneling microscope (STM). We improved the spatial resolution of the SQUID probe microscope by transmitting the magnetic field to the SQUID by use of a high permeability permalloy probe. It can measure topography of the sample surface and the magnetic field of the sample at the same time using the permalloy probe as a STM probe. In the present study, we have measured the magnetic field distribution generated by a meander line whose line plus spacing were 10 μm. The meander line is useful for estimating the performance of the STM-SQUID probe microscope because we can quantify the magnetic field of a meander line to which a current is applied. We also measured the magnetic field on the sample surface by a magnetic force microscopy (MFM) and compared these measurements to those obtained with the STM-SQUID probe microscope. The MFM measurement was influenced by the sample surface. However, this effect was not observed in the STM-SQUID measurement.