Resistance switching and nanoscale characterization of Ag/Cu based chalcogenide heterostructure
Resistance switching and nanoscale characterization of Ag/Cu based chalcogenide heterostructure
复制标题
Ag/Cu 基硫族化物异质结构的电阻切换和纳米级表征
DOI:
--
复制
发表时间:
2007
期刊:
影响因子:
--
通讯作者:
M. Aono
中科院分区:
文献类型:
--
作者:
C. H. Liang;K. Terabe;T. Hasegawa;M. Aono