Soft x‐ray pinhole imaging diagnostics for compact toroid plasmas
Soft x‐ray pinhole imaging diagnostics for compact toroid plasmas
复制标题
紧凑环形等离子体的软 X 射线针孔成像诊断
DOI：
10.1063/1.1141834
复制
发表时间：
1990
影响因子：
1.6
通讯作者：
A. D. Bailey
中科院分区：
文献类型：
--
作者：
E. Crawford;D. Taggart;A. D. Bailey
软x射线针孔成像在TRX‐2、FRX‐C/LSM器件中已成为一种有价值的场反转等离子体可视化诊断方法。带有CsI阴极和Be滤波器的门控MCP图像转换器器件，其峰值响应波长约为11 nm，用于曝光持续时间从十分之一到几微秒不等。讨论了单通道板和雪佛龙通道板的实验结果，以及胶片和CCD相机作为记录介质的线性曝光限制的估计。还讨论了FRX‐C/LSM和LSX器件上的多帧器件的规划。
Soft x‐ray pinhole imaging has recently become established as a valuable diagnostic for visualization of field reversed configuration (FRC) plasmas in the TRX‐2, FRX‐C/LSM devices. Gated MCP image converter devices with CsI cathodes and Be filters with a peak response around 11 nm wavelength are used for exposure durations ranging from a few tenths up to several microseconds. Results of experiments with single and Chevron channel plates are discussed along with estimates of linear exposure limitations with both film and CCD cameras as recording media. Plans for multiframe devices on the FRX‐C/LSM and the LSX devices are also discussed.