Filtering out slow-scan drifts in atomic force microscopy images
Filtering out slow-scan drifts in atomic force microscopy images
复制标题
滤除原子力显微镜图像中的慢扫描漂移
DOI：
10.1177/0309324711401794
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发表时间：
2011
期刊：
影响因子：
--
通讯作者：
A. Tracz
中科院分区：
文献类型：
--
作者：
H. Teyssèdre;H. Teyssèdre;S. Roux;G. Régnier;A. Tracz
从两个AFM图像，在两个正交的方向上扫描，提出了一种方法来重建参考图像，该参考图像被剥夺了每个图像的慢扫描漂移，因此受益于两个图像的快扫描精度。该方法扩展了Sun和Pang [1]最初提出的方法，被公式化为全局数字图像相关（DIC）问题。该分析不仅提供了参考图像，而且还提供了残差图，允许检查校正的有效性和慢漂移校正。该算法被应用到原子力显微镜图像的球晶轻敲模式。结果表明，人工应变高达16%，可以从这个过程中得到纠正。
From two AFM images, scanned in two orthogonal directions, a method is proposed to reconstruct a reference image that is deprived of the slow-scan drifts of each image, and hence that benefits from the fast-scan accuracy of both images. This method, extending that initially proposed by Sun and Pang [1], is formulated as a global Digital Image Correlation (DIC) problem. The analysis provides not only a reference image but also a residual map, allowing checking of the validity of the correction, and the slow-drift corrections. The algorithm is applied to AFM images of spherulites obtained in tapping mode. It is shown that artificial strains as large as 16 per cent can be corrected from this procedure.