Influence of microstructure on microwave dielectric properties of ZnTa2O6 ceramics with low dielectric loss
Influence of microstructure on microwave dielectric properties of ZnTa2O6 ceramics with low dielectric loss
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DOI：
10.1016/s0925-8388(01)01950-8
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发表时间：
2002-05
影响因子：
6.2
通讯作者：
A. Kan;H. Ogawa;H. Ohsato
中科院分区：
文献类型：
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作者：
A. Kan;H. Ogawa;H. Ohsato
研究了不同烧结条件下制备的znta2o6陶瓷的微波介电性能和形貌。x射线粉末衍射（XRPD）分析未发现杂质相的形成，而场发射扫描电镜（FE-SEM）结果显示，随着烧结温度和烧结时间的增加，样品的晶粒长大。从微波介电性能的评价来看，随着相对密度的增加，ϵrvalues的取值范围为29.5 ~ 34.5。当样品在1400℃空气中烧结10 h时，本研究获得的最大Q·f值为79 308 GHz，在不同温度下烧结2和10 h的样品的τf值约为9 ppm/°C。这些陶瓷的微波介电特性可能适合用于卫星通信中的微波介电谐振器。
The microwave dielectric properties and the morphology of ZnTa2O6ceramics prepared under different sintering conditions were studied in this work. The formation of an impurity phase was not detected by X-ray powder diffraction (XRPD) analysis, and grain growth of the samples was recognized from field emission scanning electron microscopy (FE-SEM) results when increasing the sintering temperature and sintering time. From the evaluation of microwave dielectric properties, the ϵrvalues range from 29.5 to 34.5 depending on the increase of the relative density. The maximum Q·f value obtained in this study is 79 308 GHz when the sample is sintered in air at 1400°C for 10 h. The τfvalues are approximately 9 ppm/°C in all the samples sintered at various temperatures for 2 and 10 h. These microwave dielectric properties of the ceramics may be appropriate for a microwave dielectric resonator in satellite communication.