Characterization of Superconducting Single-Electron Transistors with Small Al/AlOx/V Josephson Junctions
Characterization of Superconducting Single-Electron Transistors with Small Al/AlOx/V Josephson Junctions
复制标题
具有小型 Al/AlOx/V 约瑟夫森结的超导单电子晶体管的表征
DOI:
10.1088/0953-2048/27/11/115015
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发表时间:
2014
影响因子:
3.6
通讯作者:
and Y. Mizugaki
中科院分区:
文献类型:
--
作者:
H. Shimada;K. Miyawaki;A. Hagiwara;K. Takeda;and Y. Mizugaki
Superconducting single-electron transistors (SSETs) composed of small Al/AlOx/V junctions were fabricated, and their transport properties were investigated. The device with an Al island exhibited a supercurrent that was 2e-periodic in the gate charge while that with a V island showed a periodicity of e, where e is an elementary charge. The Josephson-quasiparticle (JQP)-cycle current appeared at the bias voltage V in the range Δ Δ+<<+ E e V E|| 3 Al c Al c, where ΔAl is the superconducting gap of Al and Ec is the charging energy of an elementary charge. This is different from the commonly accepted range for the JQP current such as that in the case of an all Al SSET. There also appeared a large leakage current at Δ Δ Δ⩽<++ e V E 2|| 2 () Al V Al c, where ΔV is the superconducting gap of V. All these properties are accounted for by considering the finite subgap quasiparticle density of states in the V electrode.