Photoexcited carrier dynamics of thin film Cd3As2 grown on a GaAs(111)B substrate by molecular beam epitaxy
Photoexcited carrier dynamics of thin film Cd3As2 grown on a GaAs(111)B substrate by molecular beam epitaxy
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通过分子束外延在 GaAs(111)B 衬底上生长的薄膜 Cd3As2 的光激发载流子动力学
DOI:
10.1103/physrevb.104.094302
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发表时间:
2021
影响因子:
3.7
通讯作者:
Zhang Xinhui
中科院分区:
文献类型:
--
作者:
Zhai Guihao;Ma Jialin;Wang Hailong;Ye Jialiang;Li Ting;Li Ying;Liang Gaoming;Zhao Jianhua;Wu Xiaoguang;Zhang Xinhui
The topological Dirac semimetalhas drawn great attention for its novel physics and technical applications in optoelectronic devices operating in the infrared and THz regimes. Exploring the photoexcited carrier dynamics inis helpful to understand the transient carrier occupation and cooling processes that are closely associated with its unconventional band characteristic. Here, the photoexcited carrier dynamics in thethin film epitaxially grown on thesubstrate was investigated by employing the time-resolved midinfrared transient reflectance measurements, along with a theoretical modeling concerning the electron-polar optical (-PO) phonon interaction. The measured photoexcited electron relaxation time ofincreases with the probe wavelength, and increases with temperature at temperatures higher than 30 K. Theoretical modeling under the framework of the two-temperature model can give qualitatively good description on both the temperature and probe wavelength dependence of the carrier relaxation time. Additionally, theoretical modeling shows that charge screening of the interaction of electrons with polar optical phonons can greatly reduce the hot carrier relaxation rate. The measured transient reflectance analyses indicate that the hot phonon effect plays a negligible role on the carrier relaxation in. Our findings provide further insight into the photoexcited carrier dynamics inand valuable reference for developing its high-performance infrared optoelectronic devices.