X-ray absorption spectroscopy of liquid surface
X-ray absorption spectroscopy of liquid surface
复制标题
液体表面X射线吸收光谱
DOI:
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发表时间:
1997
期刊:
影响因子:
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通讯作者:
M. Nomura
中科院分区:
文献类型:
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作者:
I. Watanabe;H. Tanida;Sigehiro Kawauchi;M. Harada;M. Nomura
An apparatus has been constructed for x-ray absorption spectroscopy of elements at air/aqueous solution interface. Its surface sensitivity is gained from glancing incidence of synchrotron radiation under total reflection condition. The absorption is detected by total conversion He ion-yield method. This apparatus was operated at the beam line 7C of Photon Factory, where the incident photon beam comes from a sagittal focus double-crystal monochromator via a 70-cm-long bent mirror. The mirror focuses the beam vertically and changes the beam direction downward by 1 mrad to irradiate solution surface. The essential requirement of this technique, ripple-free liquid surface at accurate position, was attained by introducing a trough on a floating boat, continuous surface level monitoring, and an automatic Z-stage control. The x-ray absorption edge jump demonstrated that surface concentration of bromide ion follows the Langmuir type adsorption for tetraalkylammonuim bromide solution. By comparing the jump values ...