Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant
Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant
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采用 Q(t) 方法和量子化学计算分析 XLPE 和含酚类抗氧化剂 PE 的电荷陷阱深度
DOI：
10.1109/ceidp50766.2021.9705439
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发表时间：
2021
期刊：
影响因子：
--
通讯作者：
Takada T.
中科院分区：
文献类型：
--
作者：
Uehara H.;Okamoto T.;Sekii Y.;Iwata S.;Takada T.
采用直流积分电荷法（Q(t)法）测量结果表明，含酚类抗氧化剂的低密度聚乙烯（LDPE+AO）样品比交联聚乙烯（XLPE）样品具有更高的电场特性和耐热性。本研究采用分子动力学模拟和量子化学计算的方法，从电荷阱深度的角度分析了LDPE+AO样品的高电场特性和耐热性。结果表明，AO的加入参与了深电荷阱的形成。
Measurements using the direct current integrated charge method (Q(t) method) revealed that the low-density polyethylene with phenolic antioxidants (LDPE+AO) sample had higher electric field characteristics and heat resistances than the cross-linked polyethylene (XLPE) sample. In this study, we analyzed the high electric field characteristics and heat resistance of the LDPE+AO sample from the standpoint of charge trap depth using molecular dynamics (MD) simulation and quantum chemical calculation. The results showed that AO addition was involved in the formation of deep charge traps.