Enhancement of Microwave Imaging Using a Metamaterial Lens
Enhancement of Microwave Imaging Using a Metamaterial Lens
复制标题
DOI：
10.1109/jsen.2019.2903454
复制
发表时间：
2019-07-01
影响因子：
4.3
通讯作者：
Tamburrino, Antonello
中科院分区：
文献类型：
--
作者：
Mukherjee, Saptarshi;Su, Zhiyi;Tamburrino, Antonello
微波远场成像技术非常适合成像源、散射体和介电或复合材料中的异常。然而，衍射极限限制了远场成像的分辨率。本文的贡献集中在设计一种基于超材料透镜的传感器以提高微波远场成像分辨率的可行性。在过去的几十年里，超材料越来越多地应用于新型微波电路和传感器系统的设计。超材料具有传统材料所不具备的亚波长特性、结构紧凑、超分辨率等优点。本文研究了利用超材料透镜对远场微波数据进行时间反转处理以提高成像分辨率的可行性。具体而言，介绍了该透镜在检测复合材料内部亚波长缺陷方面的超分辨能力。
Microwave far-field imaging techniques are well suited to image source, scatterers, and anomalies in dielectric or composite materials. However, the diffraction limits restrict the resolution of far-field imaging. This contribution focuses on the feasibility of designing a metamaterial lens based sensor for enhancing the resolution of microwave far-field imaging. Metamaterials have been increasingly used in the past few decades for the designing of novel microwave circuits and sensor systems. The unique properties of metamterials offer several advantages, such as sub-wavelength nature, compact design, and super-resolution, which is not found in the conventional materials. The feasibility of enhancing imaging resolution using a metamaterial lens along with time reversal processing of far-field microwave data is studied in this paper. Specifically, the super-resolution capability of the lens for detection of sub wavelength defects inside the composite materials is presented.