A versatile double aberration-corrected, energy filtered HREM/STEM for materials science
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science
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DOI：
10.1016/j.ultramic.2004.11.010
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发表时间：
2005-04-01
期刊：
影响因子：
2.2
通讯作者：
Sawada, H
中科院分区：
文献类型：
--
作者：
Hutchison, JL;Titchmarsh, JM;Sawada, H
一个HREM/STEM结合像差校正器在探头形成和成像镜头已安装在牛津大学。这种独特的仪器还配备了柱内能量损失（Ω型）过滤器，过滤器上方和下方的HAADF检测器以及EDX系统。初步测试表明，它能够在TEM和HAADF STEM成像模式下达到0.1 nm的分辨率。最后给出了一些应用实例。(c)2004 Elsevier B. V.保留所有权利。
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of similar to 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented. (c) 2004 Elsevier B.V. All rights reserved.