Investigation of Noisy Film Boiling Under Various Thermal Conditions in He II

Investigation of Noisy Film Boiling Under Various Thermal Conditions in He II
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He II 中不同热条件下的噪声膜沸腾研究

DOI:
10.1007/978-1-4615-4215-5_8
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发表时间:
2000
期刊:
Advances in cryogenic engineering
影响因子:
--
通讯作者:
Y. Takashima
Y. Takashima
中科院分区:
--
文献类型:
--
作者:
Peng;M. Murakami;Ruzhu Wang;Y. Takashima

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在本研究中,噪声膜沸腾在He II的一些实验结果。通过对不同热态条件(如不同浴温、不同浸没深度、不同热流密度、不同加热器几何形状和尺寸)下噪声膜沸腾压力振荡的研究,发现当浴温接近λ温度时,对沸腾状态有重要影响。区分不同沸腾状态的临界浸入深度随浴温变化而变化。噪声膜态沸腾的主频对热流密度的依赖性很小,而加热器的几何形状和尺寸对其影响很大。压力传感器和超导温度传感器的同步测量结果表明,噪声膜沸腾过程中的压力振荡和温度振荡之间存在很强的相关性。
In the present study, some experimental results on noisy film boiling in He II are presented. Based on the study of the pressure oscillation of noisy film boiling under various thermal conditions, e.g. different bath temperature, immersion depth, heat flux, geometrical configuration and size of the heater, it is found that the bath temperature has a vital effect on the boiling state when it is close to the λ temperature. The critical immersion depth dividing different boiling states varies as bath temperature changes. The dominant frequency of noisy film boiling state shows little dependence on heat flux, while the geometrical configuration and size of the heater affects it drastically. Simultaneous measurement results from pressure sensor and superconductor temperature sensor show that a strong correlation exists between the pressure oscillation and the temperature oscillation during noisy film boiling.