Microspectroscopic two-dimensional Fermi surface mapping using a photoelectron emission microscope
Microspectroscopic two-dimensional Fermi surface mapping using a photoelectron emission microscope
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DOI：
10.1063/1.1569404
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发表时间：
2003-05-01
影响因子：
1.6
通讯作者：
Kirschner, J
中科院分区：
文献类型：
--
作者：
Kotsugi, M;Kuch, W;Kirschner, J
我们演示了将光电子发射显微镜与减速场电子能量分析仪结合使用，以快速采集二维动量分辨光电子角分布图案。这使得在同一仪器内结合光电子的空间、动量和能量分辨率成为可能。我们已应用此方法从样品的选定区域观察 Cu(001) 费米表面。通过这种方式可以快速绘制明确定义的体费米面。 (C) 2003 年美国物理研究所。
We demonstrate the use of a photoelectron emission microscope in connection with a retarding field electron energy analyzer for the fast acquisition of two-dimensional momentum resolved photoelectron angular distribution patterns. This opens the possibility to combine spatial, momentum, and energy resolution of photoelectrons within the same instrument. We have applied this to observe the Cu(001) Fermi surface from a selected region of the sample. A well defined bulk Fermi surface is quickly mapped in this way. (C) 2003 American Institute of Physics.