A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
复制标题
DOI：
10.1109/tgrs.2008.919822
复制
发表时间：
2008-08
影响因子：
8.2
通讯作者：
Tzong-Dar Wu;Kun Shan Chen;Jiancheng Shi;Hung-Wei Lee;A. Fung
中科院分区：
文献类型：
--
作者：
Tzong-Dar Wu;Kun Shan Chen;Jiancheng Shi;Hung-Wei Lee;A. Fung
本文采用一种先进的积分方程模型（AIEM）研究了双基地散射。通过保留基尔霍夫表面场中的所有表面电流项，得到了双稳态散射系数。为简化起见，没有将完全Kirchhoff场转化为互补场的推导。我们在各自的有效区域比较了各种更新版本的基于iem的模型与小扰动模型、几何光学模型和Kirchhoff近似标准模型。结果表明，新的AIEM对双基地散射的预测更为准确。
In this paper, we study the bistatic scattering using an advanced integral equation model (AIEM). By keeping all the surface current terms in the Kirchhoff surface fields, the bistatic scattering coefficients are obtained. For simplification, the complete Kirchhoff field did not cast into the derivation of the complementary field. We compare varied updated versions of IEM-based models with the small perturbation model, geometrical optics model, and Kirchhoff approximation standard models at respective regions of validity. The results indicate that the new AIEM provides much more accurate predictions for bistatic scattering.