Sensitivity of X-ray grating interferometry
Sensitivity of X-ray grating interferometry
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DOI：
10.1364/oe.19.018324
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发表时间：
2011-09-12
期刊：
影响因子：
3.8
通讯作者：
Stampanoni, M.
中科院分区：
文献类型：
--
作者：
Modregger, P.;Pinzer, B. R.;Stampanoni, M.
众所周知，X射线相衬光栅干涉测量法对于样品中存在的电子密度变化的灵敏度与最小可检测折射角有关。在这篇文章中，一个数值框架的开发，允许一个现实的和定量的灵敏度测定。该框架通过与实验结果的比较进行验证，然后用于量化的几个影响的灵敏度，如空间相干性或相位阶跃图像的数量。特别是，我们确定了理想的光栅间距离相对于平行光束几何形状的最高灵敏度。这些知识将有助于优化现有的基于同步加速器的光栅干涉测量装置。(C)2011年美国光学学会
It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article a numerical framework is developed that allows for a realistic and quantitative determination of the sensitivity. The framework is validated by comparisons with experimental results and then used for the quantification of several influences on the sensitivity, such as spatial coherence or the number of phase step images. In particular, we identify the ideal inter-grating distance with respect to the highest sensitivity for parallel beam geometry. This knowledge will help to optimize existing synchrotron-based grating interferometry setups. (C) 2011 Optical Society of America