The investigation of light outcoupling in blue top-emitting OLEDs
The investigation of light outcoupling in blue top-emitting OLEDs
复制标题
蓝色顶发射 OLED 中光耦合的研究
DOI：
10.1117/12.869974
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发表时间：
2010-11
期刊：
影响因子：
--
通讯作者：
Liu, Bin
中科院分区：
文献类型：
--
作者：
Deng, Ling-ling;Chen, Shu-fen;Huang, Wei;Liu, Bin
采用经典的电磁场理论研究了以钐/银（Sm/Ag）双层膜为阴极的蓝色顶发射有机电致发光器件（TEOLED）中的光外耦合。利用该方法，模拟了具有不同顶电极和外耦合层的器件的外耦合效率和光谱。计算结果表明，在器件中，Ag膜厚度的增加将导致蓝光发射的红移和发射强度的降低。而Sm膜的厚度只影响器件的发光强度。改变外耦合层的厚度以获得饱和和有效的蓝光发射，然后确定最佳厚度。主要由具有相对高反射率的双层阴极引起的微腔效应被认为是解释蓝色TEOLED的光学特性，包括一些异常现象。模拟结果与实测数据吻合较好。
A classic electromagnetic theory is used in this paper to investigate the light outcoupling in blue top-emitting organic light-emitting devices (TEOLEDs) with a samarium/silver (Sm/Ag) bilayer cathode. With the method, the outcoupling efficiency and the spectra of the devices with different top-electrodes and outcoupling layers were simulated. The calculated results demonstrate that in the devices, the increasing thickness of the Ag film would result in the redshift of blue emission and the decrease of emission intensity. While the thickness of the Sm film only influences the emission intensity of the devices. The thickness of the outcoupling layer is varied to obtain the saturated and efficient blue emission and then the optimal thickness is determined. The microcavity effect induced mainly by the bilayer cathode with a relatively high reflectivity is considered to explain the optical characteristics of the blue TEOLEDs, including some abnormal phenomena. The simulated results show good agreement with the measured data.
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影响因子：
4
作者：
C. J. Lee;R. B. Pode;J. Han;D. Moon
通讯作者：
C. J. Lee;R. B. Pode;J. Han;D. Moon
DOI：
10.1016/j.mseb.2005.04.004
发表时间：
2005-08
影响因子：
3.6
作者：
D. Moon;R. B. Pode;C. J. Lee;J. I. Han
通讯作者：
D. Moon;R. B. Pode;C. J. Lee;J. I. Han
影响因子：
2.1
作者：
Shih-Feng Hsua;Chung-Chun Leeb;Shiao-Wen Hwanga;Hsian-Hung Chena;Chin H. Chena;Andrew T. Hub
通讯作者：
Shih-Feng Hsua;Chung-Chun Leeb;Shiao-Wen Hwanga;Hsian-Hung Chena;Chin H. Chena;Andrew T. Hub
影响因子：
--
作者：
LUKOSZ, W
通讯作者：
LUKOSZ, W
影响因子：
2.8
作者：
Yanqing Li;J. X. Tang;Zhiyuan Xie;L. Hung;S. Lau
通讯作者：
Yanqing Li;J. X. Tang;Zhiyuan Xie;L. Hung;S. Lau