Soft Error Tolerant Quasi-Delay Insensitive Asynchronous Circuits: Advancements and Challenges
Soft Error Tolerant Quasi-Delay Insensitive Asynchronous Circuits: Advancements and Challenges
复制标题
软容错准延迟不敏感异步电路：进步和挑战
DOI：
10.1109/sbcci53441.2021.9530001
复制
发表时间：
2021
期刊：
影响因子：
--
通讯作者：
Ashiq A. Sakib
中科院分区：
文献类型：
--
作者：
Ashiq A. Sakib
对辐射或其他噪声源引起的软错误的敏感性是在扩展的技术节点上以有限的电源电压运行的设备的主要问题。这些错误是偶尔出现的异常情况，会引起单粒子效应(请参见)，从而可能破坏电路功能。尽管对时序变化的不敏感性使得准延迟不敏感(QDI)电路能够稳健地抵抗许多影响基于CMOS的同步数字电路的时序行为的辐射或噪声效应，但它们仍然容易受到软错误的影响。文献中存在用于QDI电路的各种错误检测、抑制和辐射加固方案。本文对现有技术进行了全面的概述，并对它们的意义、性能和局限性进行了比较分析。
Susceptibility to soft errors caused by radiation or other noise sources is a major concern for devices operating with limited supply voltages at scaled technology nodes. These errors are occasional abnormalities that give rise to single event effects (SEE), which may corrupt the circuit functionality. Although the insensitivity to timing variations allows quasi delay insensitive (QDI) circuits to be robust against many of the radiation or noise effects that affect the timing behavior of CMOS based synchronous digital circuits, they are still susceptible to soft errors. Various error detection, mitigation, and radiation hardening schemes for QDI circuits exist in the literature. This paper provides a comprehensive overview of the existing techniques and a comparative analysis of their significance, performance, and limitations.