Register variation explains stylometric authorship analysis

Register variation explains stylometric authorship analysis
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语域变异解释了文体作者身份分析

DOI:
10.1515/cllt-2022-0040
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发表时间:
2023
影响因子:
1.6
通讯作者:
J. Grieve
J. Grieve
中科院分区:
人文科学2区
文献类型:
--
作者:
J. Grieve

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摘要几个世纪以来,对有争议的作者身份的调查表明,人们有独特的写作风格。如果有足够的数据,通常可以区分一小群作者的作品,例如,通过对常见功能词的相对频率进行多变量分析。然而,对于为什么这种类型的风格分析是成功的,没有公认的解释。作者身份分析者经常认为作者用微妙不同的方言写作,但对单个单词的分析并不符合社会语言学变异的标准理论。另外,文体分析与语域变异的标准理论是一致的。在本文中,我认为文体测量方法之所以有效,是因为作者使用了微妙不同的语域。为了支持这一主张,我提出了平行的文体和多维寄存器分析的两个专栏作家写的报纸文章的语料库的结果。我证明,这两种分析不仅区分这些作者,但确定相同的语言变异的潜在模式。因此,我建议,寄存器的变化,而不是方言的变化,提供了一个基础来解释这些差异,并解释文体分析的作者更普遍。
Abstract For centuries, investigations of disputed authorship have shown that people have unique styles of writing. Given sufficient data, it is generally possible to distinguish between the writings of a small group of authors, for example, through the multivariate analysis of the relative frequencies of common function words. There is, however, no accepted explanation for why this type of stylometric analysis is successful. Authorship analysts often argue that authors write in subtly different dialects, but the analysis of individual words is not licensed by standard theories of sociolinguistic variation. Alternatively, stylometric analysis is consistent with standard theories of register variation. In this paper, I argue that stylometric methods work because authors write in subtly different registers. To support this claim, I present the results of parallel stylometric and multidimensional register analyses of a corpus of newspaper articles written by two columnists. I demonstrate that both analyses not only distinguish between these authors but identify the same underlying patterns of linguistic variation. I therefore propose that register variation, as opposed to dialect variation, provides a basis for explaining these differences and for explaining stylometric analyses of authorship more generally.
DOI: 10.1002/asi.v60:3
发表时间: 2009-03
影响因子: 3.5
作者:
N. Shibata;Y. Kajikawa;Y. Takeda;K. Matsushima
通讯作者: N. Shibata;Y. Kajikawa;Y. Takeda;K. Matsushima