Dielectric Properties of an Ultra‐Low‐Temperature Cofiring Bi2Mo2O9 Multilayer
Dielectric Properties of an Ultra‐Low‐Temperature Cofiring Bi2Mo2O9 Multilayer
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DOI：
10.1111/j.1551-2916.2010.03602.x
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发表时间：
2010-05
影响因子：
3.9
通讯作者：
Di Zhou;C. Randall;Amanda Baker;Hong Wang;L. Pang;X. Yao
中科院分区：
文献类型：
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作者：
Di Zhou;C. Randall;Amanda Baker;Hong Wang;L. Pang;X. Yao
采用带式铸造和丝网印刷成形技术制备了Bi2Mo2O9多层陶瓷电容器结构。使用一种新型的母材Al作为内部电极，并在645℃的空气中共烧结这些电介质。利用扫描电镜和能谱仪（EDS）对电极层和陶瓷层之间的局部化学相容性进行了研究，发现电极层和陶瓷层之间没有发生反应或相互扩散。在- 55°- +175°C的温度范围内，测量了电极单片陶瓷、多层陶瓷和单层陶瓷样品在100 Hz-10 MHz的介电性能；介电性能的值与体测量值相似，与没有任何界面反应一致。综上所述，这些数据表明，利用低温烧成Bi2Mo2O9陶瓷和Al内电极进行超低温共烧陶瓷技术是可能的。
A Bi2Mo2O9 multilayer ceramic capacitor structure was fabricated in a thick-film process involving tape casting and screen-printing forming techniques. A novel base metal, Al, was used as the internal electrode, and these dielectrics were co-sintered at 645°C in air. Scanning electron microscopy and energy dispersive spectroscopy (EDS) were used to investigate the local chemical compatibility between the electrode layer and ceramic layer, and no reaction or interdiffusion was found. Dielectric properties of electroded monolithic ceramic, multilayer, and monolayer samples at 100 Hz–10 MHz in a temperature range of −55°–+175°C were measured; values of the dielectric properties were similar to bulk measurements consistent with the absence of any interfacial reaction. Collectively, the data show that it is possible to use the low-temperature firing Bi2Mo2O9 ceramic and Al internal electrode for an ultra-low-temperature cofired ceramic technology.