A Novel Microwave Tomography System Based on the Scattering Probe Technique
A Novel Microwave Tomography System Based on the Scattering Probe Technique
复制标题
基于散射探针技术的新型微波层析成像系统
DOI：
10.1109/tim.2011.2161931
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发表时间：
2012
影响因子：
5.6
通讯作者：
J. Lovetri
中科院分区：
文献类型：
--
作者：
M. Ostadrahimi;M. Mojabi;S. Noghanian;L. Shafai;S. Pistorius;J. Lovetri
在本文中，我们介绍了一种新型的微波层析成像系统，它利用24个双层Vivaldi天线，每个天线都配备了一个二极管加载的印刷线探头。通过偏置探针的二极管，探针的阻抗被修改，允许在探针的位置处的电场的间接测量。每个印刷线探针都装有五个等间距的p-i-n二极管，串联。我们表明，以这种方式收集的电场数据内建议的层析成像系统可以用来重建感兴趣的对象的介电特性。显示了各种对象的重建。虽然结果仍然是初步的，但已经进行了足够的实验来描绘这种收集用于断层成像目的的散射场数据的间接方法的优点。
In this paper, we introduce a novel microwave tomography system, which utilizes 24 double-layered Vivaldi antennas, each of which is equipped with a diode-loaded printed-wire probe. By biasing the probe's diodes, the impedance of the probe is modified, allowing an indirect measurement of the electric field at the probe's locations. Each printed-wire probe is loaded with five equally spaced p-i-n diodes, in series. We show that electric field data collected in this way within the proposed tomography system can be used to reconstruct the dielectric properties of an object of interest. Reconstructions for various objects are shown. Although the results are still preliminary, sufficient experimentation has been done to delineate the advantages of such an indirect method of collecting scattered-field data for tomographic imaging purposes.