Accurate determination of the temperature and frequency dependent smectic C biaxial permittivity tensor
Accurate determination of the temperature and frequency dependent smectic C biaxial permittivity tensor
复制标题
精确测定温度和频率相关的近晶 C 双轴介电常数张量
DOI：
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发表时间：
1999
期刊：
影响因子：
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通讯作者：
J. C. Jones
中科院分区：
文献类型：
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作者：
C. Brown;J. C. Jones
直接测量了商用近晶C液晶混合物的温度和频率依赖性近晶C弯曲（B1）和展曲（B2）弹性常数和折射率e1、e2和e3。这已经实现了使用连续建模，以适应在C2U的人字形几何形状的介电常数的交流场的依赖性。拟合过程还利用垂直介电常数、层倾角和近晶锥角的测量值。这种方法消除了以前测量中固有的许多假设，提高了结果的准确性。
The temperature and frequency dependent smectic C bend (B1) and splay (B2) elastic constants and permittivities e1, e2, and e3 have been measured directly for a commercial smectic C liquid crystal mixture. This has been achieved using continuum modelling to fit the ac field dependence of the permittivity in the C2U chevron geometry. The fitting procedure also makes use of measured values for the homeotropic permittivity, the layer tilt angle, and smectic cone angle. This approach removes many of the assumptions which were inherent in previous measurements giving improved accuracy in the results.