Exchange between deep donors in semiconductors: A quantum defect approach
Exchange between deep donors in semiconductors: A quantum defect approach
复制标题
半导体深层供体之间的交换:量子缺陷方法
DOI:
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发表时间:
2007
期刊:
影响因子:
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通讯作者:
A. Fisher
中科院分区:
文献类型:
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作者:
Wei Wu;A. Fisher
Exchange interactions among defects in semiconductors are commonly treated within effective-mass theory using a scaled hydrogenic wave function. However, such a wave function is only applicable to shallow impurities; here, we present a simple but robust generalization to treat deep donors, in which we treat the long-range part of the wave function using the well-established quantum defect theory, and include a model central-cell correction to fix the bound-state eigenvalue at the experimentally observed value. This allows us to compute the effect of binding energy on exchange interactions as a function of donor distance; this is a significant quantity given recent proposals to carry out quantum information processing using deep donors. As expected, exchange interactions are suppressed or increased, compared to the hydrogenic case, by the greater localization or delocalization of the wave functions of deep donors or “supershallow” donors with binding energy less than the hydrogenic value. The calculated results are compared with a simple scaling of the Heitler-London hydrogenic exchange; the scaled hydrogenic results give the correct order of magnitude but fail to reproduce quantitatively our calculations. We calculate the donor exchange in silicon including intervalley interference terms for donor pairs along the 100 direction, and also show the influence of the donor type on the distribution of nearest-neighbor exchange constants at different concentrations. Our methods can be used to compute the exchange interactions between two donor electrons with arbitrary binding energy.