A novel method of systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformation
A novel method of systematic quantitative characterization for the mechanical robustness of flexible thin film devices against repeated bending deformation
复制标题
一种系统定量表征柔性薄膜器件针对重复弯曲变形的机械鲁棒性的新方法
DOI：
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发表时间：
2022
期刊：
影响因子：
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通讯作者：
S. Kamiya
中科院分区：
文献类型：
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作者：
H. Izumi;M. Nomura;Y. Haga;H. Sugiyama;S. Kamiya
