Positron annihilation lifetime spectroscopy study of Kapton thin foils
Positron annihilation lifetime spectroscopy study of Kapton thin foils
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DOI：
10.1088/0022-3727/49/2/025305
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发表时间：
2016-01
期刊：
影响因子：
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通讯作者：
G. Kanda;L. Ravelli;B. Löwe;W. Egger;D. Keeble
中科院分区：
文献类型：
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作者：
G. Kanda;L. Ravelli;B. Löwe;W. Egger;D. Keeble
报道了聚酰亚胺材料Kapton的可变能量正电子湮没寿命谱（VE-PALS）实验。薄Kapton箔广泛用于各种机械、电子应用中。帕尔斯提供了一个灵敏的探针空位相关的缺陷，在广泛的材料，包括开放体积的聚合物。改变正电子注入能量使得能够直接测量薄箔。薄Kapton箔也通常用于在用未慢化放射性核素源执行的常规帕尔斯测量中封装正电子源材料。本文报道了7.6 μm和25 μm Kapton薄膜正电子寿命的深度剖面测量结果，确定了385（1）ps寿命分量占主导地位。由于正电子素形成的显着纳秒寿命组件的情况下被证实。
Variable energy positron annihilation lifetime spectroscopy (VE-PALS) experiments on polyimide material Kapton are reported. Thin Kapton foils are widely used in a variety of mechanical, electronic applications. PALS provides a sensitive probe of vacancy-related defects in a wide range of materials, including open volume in polymers. Varying the positron implantation energy enables direct measurement of thin foils. Thin Kapton foils are also commonly used to enclose the positron source material in conventional PALS measurements performed with unmoderated radionuclide sources. The results of depth-profiled positron lifetime measurements on 7.6 μm and 25 μm Kapton foils are reported and determine a dominant 385(1) ps lifetime component. The absence of significant nanosecond lifetime component due to positronium formation is confirmed.