Structural and multiferroic properties of BiFeO3 thin films at room temperature
Structural and multiferroic properties of BiFeO3 thin films at room temperature
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DOI：
10.1063/1.1775045
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发表时间：
2004-09
影响因子：
3.2
通讯作者：
K. Yun;M. Noda;M. Okuyama;H. Saeki;H. Tabata;K. Saito
中科院分区：
文献类型：
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作者：
K. Yun;M. Noda;M. Okuyama;H. Saeki;H. Tabata;K. Saito
采用脉冲激光沉积技术，在450℃、0.15 ~ 0.005 torr的不同氧压条件下，在Pt / TiO2 / SiO2 / Si衬底上制备了BiFeO3薄膜。在室温下研究了沉积压力对其晶体结构和多铁性的影响。x射线衍射分析（θ-2θ扫描和二维扫描）表明，BiFeO3薄膜由钙钛矿单相组成，具有四方晶体结构，空间群为P4mm。随着氧压的降低，膜的c轴晶格常数（4.062 ~ 4.006 a）减小，c / a比值从1.032减小到1.014。薄膜的表面粗糙度和晶粒尺寸很大程度上取决于氧气压力。膜的介电常数随氧压的降低而减小。在0.05Torr下沉积的薄膜具有稳定的电流密度和良好饱和的磁滞回线，剩余极化（2Pr）为136μC∕cm2，矫顽力场（2Ec）为109kV∕cm。BiFeO3薄…
BiFeO3 thin films have been prepared on Pt∕TiO2∕SiO2∕Si substrates under various oxygen pressures of 0.15–0.005Torr at a temperature of 450°C by pulsed-laser deposition. The effects of deposition pressure on their crystal structure and multiferroic properties have been investigated at room temperature. X-ray diffraction analysis (θ-2θ scans and 2-dimensional scans) shows that the BiFeO3 thin films consist of perovskite single phase with tetragonal crystal structure and space group P4mm. The c-axis lattice constant decreases (4.062–4.006A) and c∕a ratio of the films decreases from 1.032 to 1.014 with a decrease in the oxygen pressure. The surface roughness and grain size of the films depend dramatically on oxygen pressures. The dielectric constant of the films decreases with decreasing oxygen pressure. The film deposited at 0.05Torr shows a stable current density and well-saturated hysteresis loop with twice the remanent polarization (2Pr) of 136μC∕cm2 and coercive field (2Ec) of 109kV∕cm. The BiFeO3 thin ...