Sample handling, preparation and mounting for XPS and other surface analytical techniques
Sample handling, preparation and mounting for XPS and other surface analytical techniques
复制标题
XPS 和其他表面分析技术的样品处理、制备和安装
DOI：
10.1116/6.0000421
复制
发表时间：
2020
期刊：
影响因子：
--
通讯作者：
C. Donley
中科院分区：
文献类型：
--
作者：
F. Stevie;Roberto Garcia;J. Shallenberger;J. Newman;C. Donley
样品制备和封样是X射线光电子能谱（XPS）分析的重要方面。新用户并不知道许多有多年经验的分析师所熟悉的技术，这些观察结果和“交易技巧”通常不会公布。本文旨在传达作者在这一领域的经验，他们创造性地分析了广泛的样本。样品可以包括固体、粉末、纤维、多孔固体，甚至液体。这一信息对提交样本进行分析的任何人也很重要，因为样本的制备可能影响所收集数据的有用性。这些技术也适用于其他表面分析方法。
Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and “tricks of the trade” are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.