IEEE 342-node low voltage networked test system
IEEE 342-node low voltage networked test system
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DOI:
10.1109/pesgm.2014.6939794
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发表时间:
2014-07
期刊:
影响因子:
--
通讯作者:
K. Schneider;Phillipe Phanivong;J. Lacroix
中科院分区:
文献类型:
--
作者:
K. Schneider;Phillipe Phanivong;J. Lacroix
The IEEE Distribution Test Feeders provide a benchmark for new algorithms to the distribution analysis community. The low voltage network test feeder represents a moderate size urban system that is unbalanced and highly networked. This is the first distribution test feeder developed by the IEEE that contains unbalanced networked components. The 342-node Low Voltage Networked Test System includes many elements that may be found in a networked system: multiple 13.2kV primary feeders, network protectors, a 120/208V grid network, and multiple 277/480V spot networks. This paper presents a brief review of the history of low voltage networks and how they evolved into the modern systems. This paper will then present a description of the 342-Node IEEE Low Voltage Network Test System and power flow results.